Cambridge Display Technology offers three highly advanced, flexible and user-friendly Eclipse systems for lifetime testing of a broad range of light emitting and TFT devices:

• DDU System
• DC-DDU System
• TFT-DDU System

DDU System
The digital drive units (DDUs) offer dc drive or rectangular pulsed drive in either constant voltage or current mode, with manual setting of the drive conditions. They can also operate in constant luminance mode. They are fully automated and controlled by the PC which is supplied with the system.

Each system consists of a set of source-measure channels and corresponding fixtures for the testing of many devices in parallel. All test channels are linked to a PC which records, manages and presents the data.

DC-DDU System
This is a new model specifically designed for DC-only applications. Maintaining all the
DC functionally of the successful DDU range with a much simpler and compact architecture.

The DC digital drive units offer DC-drive in constant voltage, current or luminance mode. They are fully automated and controlled by the PC which is supplied with the system.

TFT-DDU System
CDT has developed a new product targeting the Thin Film Transistors (TFT) market, including conventional a-Si, LTPS, and the emerging Organic-TFT market.

The system is able to measure full transistor characteristics as well as performance reliability over time. The unique capabilites of the Eclipse platform enables rapid configuration of measurements tailored to individual customer requirements.

Each system consists of a workstation, a set of source-measure channels (for the testing of many devices types in parallel) and a custom test fixture, customised for your specific applications.

The TFT-DDU system delivers many of the capabilities of a semiconductor parameter analyser (SPA) at radically lower cost.

Part of a typical Eclipse system in 19" racking

A typical Eclipse system includes the following:

Software for measurement of IVL (current / voltage / luminance), lifetime or both
19" rack for drive units
One or more drive units, each drive unit containing eight independent drive channels
Communication cables connecting PC to each drive unit (daisy chain)
One test fixture for each drive channel
Cables from each drive channel to a test box
Documentation
Spare parts for drive units, spare communication card.

The versatile software is a particular strength of the system, offering an easy to use interface, a large range of different options for data collection, data exchange and data comparison.

Specially developed to meet the needs of researchers, device engineers and test engineers, the simplicity and ease of use of the software can facilitate and accelerate device testing and shorten development programmes.

Sample screen shot

Click to enlarge (warning - large file)

Some important features of the software include:

• Real-time data collection every two seconds
• Data collection from different devices in a single experiment (temperature, initial luminance, On-Off data collection per device)
• Real-time graphical representation of lifetime data
• Parallel data collection for multiple experiments
• Ability to sort and view experiments as a function of different parameters (material, process, lifetime conditions etc)
• Data viewing and sharing across networks or via email
• Real-time predictive half-life extrapolation algorithms

The unique Eclipse software is fully supported and updated regularly to reflect the growing needs of our customers.